High resolution Bragg-Fresnel optics for nanometer scale methods with soft X-rays
نویسنده
چکیده
The main principles and some applications of Bragg-Fresnel multilayer optics are described. An elliptical Bragg-Fresnel multilayer lens (BFML), designed and fabricated in the IMT RAS has been used for Zdimensional focusing of the white X-ray synchrotron beam. For the beam energy of about 12 KeV the spot size checked with the knife edge method was about lpm. As an example of a successful application of this optical element in x-ray imaging, the fluorescence X-Ray scanning LURE-IMT microprobe is discussed. The results of 2-D scanning images with submicron resolution of a test object in transmission and fluorescence mode are also presented.
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Principles of Bragg-Fresnel multilayer optics
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